奥林巴斯 BX53-P 偏光显微镜_偏光显微镜

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奥林巴斯 BX53-P 偏光显微镜

品牌名称：奥林巴斯

商品型号：BX53-P

起订量：1台

最小包装量：1台

配送时间：电议

联系方式：联系客服微信联系电话沟通 0512-86663366

服务承诺：正品保障大量现货诚信服务快捷配送专用发票

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商品介绍技术参数订购信息相关资料

UIS2 Optics Provide Outstanding Expandability

Maximizing the advantages of infinity correction, the UIS2 optical system helps prevent the deterioration of optical microscope performance and eliminates magnification factors, even when polarizing elements, like analyzers, tint plates, or compensators, are introduced into the light path. The BX53-P microscope also accepts intermediate attachments available for BX3 series microscopes, as well as cameras and imaging systems.

UIS2 Optics Provide Outstanding Expandability

Zonal structure of Plagioclase in quartz diorite. *Scales Indicate actual size of samples

UIS2 Optics Provide Outstanding Expandability

Optical texture of MBBA *Scales Indicate actual size of samples

	Bertrand Lens for Conoscopic and Orthoscopic Observations With a conoscopic observation attachment, switching between orthoscopic and conoscopic observation is simple. It is focusable for viewing of clear back focal plane interference patterns. The Bertrand lens is focusable for clear viewing back focal plane interference patterns. The field stop makes it possible to consistently obtain sharp conoscopic images.

Bertrand Lens for Conoscopic and Orthoscopic Observations

With a conoscopic observation attachment, switching between orthoscopic and conoscopic observation is simple. It is focusable for viewing of clear back focal plane interference patterns. The Bertrand lens is focusable for clear viewing back focal plane interference patterns. The field stop makes it possible to consistently obtain sharp conoscopic images.

An Extensive Range of Compensators and Wave Plates

Six different compensators are available for measurements of birefringence in rock and mineral thin sections. Measurement retardation level ranges from 0 to 20λ. For easier measurement and high image contrast, Berek and Senarmont
compensators can be used, which change the retardation level in the entire field of view.

An Extensive Range of Compensators and Wave Plates

MEASURING RANGE OF COMPENSATORS

Compensator	Measurement Range	Applications
Thick Berek (U-CTB)	0–11000 nm (20λ)	Measurement of high retardation level (R*>3λ), (crystals, macromolecules,fi ber, etc.)
Berek (U-CBE)	0–1640 nm (3λ)	Measurement of retardation level (crystals,macromolecules, living organisms, etc.)
Senarmont Compensator (U-CSE)	0–546 nm (1λ)	Measurement of retardation level (crystals, living organisms, etc.); enhancement of image contrast (living organisms,etc.)
Brace-Koehler Compensator1/10λ (U-CBR1)	0–55 nm (1/10λ)	Measurement of low retardation level (living organisms, etc.)
Brace-Koehler Compensator1/30λ (U-CBE2)	0–20 nm (1/30λ)	Measurement of image contrast (living organisms,etc.)
Quartz Wedge (U-CWE2)	500–2200 nm (4λ)	Approximate measurement of retardation level (crystal, macromolecules, etc.)

*R = retardation level
For more accurate measurement, we recommend that compensators (except U-CWE2) be used together with the interference fi lter 45-IF546

	Minimal Strain Optics Our polarized light objectives reduce internal strain to a minimum. This means a higher EF value, resulting in excellent image contrast.

Minimal Strain Optics

Our polarized light objectives reduce internal strain to a minimum. This means a higher EF value, resulting in excellent image contrast.

Robust and Accurate Rotating Stage

The rotating-centering mechanism attached to the rotary stage enables smooth rotation of a specimen. In addition, there is a click-stop mechanism at each 45 degrees for precise measurement. With the optional dual-mechanical stage, discreet X-Y movement is possible.

Dual-mechanical Stage

观察方法	明场		✓
	偏光		✓
	简易偏光		✓
聚焦	聚焦机制	载物台聚焦	✓
载物台	机械式	精密可旋转式载物台	旋转角度：360度
聚光镜	手动	偏光聚光镜	NA 0.9 / WD 1.3毫米（载玻片1.5毫米）（4X-100X）
观察筒	宽视场(FN 22)	三目观察筒	✓
观察筒	宽视场(FN 22)	倾斜式三目观察筒	✓
尺寸（宽×深×高）			274 (W) x 436 (D) x 535 (H) mm
重量			16 kg